The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2006
Filed:
Jun. 15, 2004
Yang-hung Shih, Hsinchu, TW;
Ying-chieh Tu, Changhua Hsien, TW;
Yang-Hung Shih, Hsinchu, TW;
Ying-Chieh Tu, Changhua Hsien, TW;
Mediatek Inc., Hsinchu, TW;
Abstract
Methods for obtaining a sampling phase to generate image information according to an analog image signal and timing information are performed. In an exemplary method, sampling clocks having a predetermined phase difference therebetween is sequentially generated according to timing information. The analog image signal is sampled using the sampling clocks, and sequential sampled values corresponding to each sampling clock are generated. The sampled values are detected to obtain edges formed by the sampled values. Magnitudes of the edges are accumulated to generate accumulation values. An optimum sampling clock is obtained according to the accumulation values. The optimum sampling clock corresponding to the accumulation value is the largest one among the accumulation values corresponding to the adjacent sampling clocks, and the difference among the accumulation values corresponding to the adjacent sampling clocks is within a predetermined range. The analog image signal is sampled using the sampling clock corresponding to the selected accumulation value.