The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2006
Filed:
Sep. 29, 2004
Seung H. Kang, Sinking Spring, PA (US);
Subramanian Karthikeyan, Schnecksville, PA (US);
Sailesh M. Merchant, Macungie, PA (US);
Seung H. Kang, Sinking Spring, PA (US);
Subramanian Karthikeyan, Schnecksville, PA (US);
Sailesh M. Merchant, Macungie, PA (US);
Agere Systems, Inc., Allentown, PA (US);
Abstract
Method and test structures for determining heating effects in a test semiconductor device () are provided. The test device may include a first conductive metal structure () for accepting a flow of electric current that causes a heating effect. The test device may further include a second conductive metal structure proximate () the first conductive structure for obtaining resistivity changes in response to the heating effect. The resistivity changes are indicative of temperature changes due to the heating effect.