The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2006
Filed:
Dec. 26, 2002
Yuzo Otsuka, Tokyo, JP;
Yuzo Otsuka, Tokyo, JP;
Abstract
An object of the present invention is to provide a seal condition inspection apparatus capable of reliably inspecting seal condition. The seal condition inspection apparatus includes an electrically-variable-quantity detecting section for detecting an electrically variable quantity at a portion (F) to be inspected for seal condition; a seal condition indicator value calculation processing means for calculating, on the basis of the electrically variable quantity, a seal condition indicator value indicative of seal condition of the portion (F) to be inspected; and a seal condition judgment processing means for judging from the seal condition indicator value whether seal condition is good or defective. In this case, the seal condition indicator value of the portion (F) to be inspected is calculated on the basis of the electrically variable value of the portion (F) to be inspected, and whether seal condition is good or defective is judged on the basis of the seal condition indicator value. Therefore, occurrence of a seal defect can be judged without involvement of an operator's subjectivity. As a result, seal condition can be reliably inspected.