The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2006

Filed:

Apr. 30, 2004
Applicants:

James M. Mckendry, Headington, GB;

Robert Selway, Kidlington, GB;

Jozef A. W. M. Corver, Nuenen, NL;

Inventors:

James M. McKendry, Headington, GB;

Robert Selway, Kidlington, GB;

Jozef A. W. M. Corver, Nuenen, NL;

Assignee:

The BOC Group, Inc., Murray Hill, NJ (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method () insures that the characteristics of the magnetic field used in a magnetic resonance check weighing system () for samples in vials () on a production line track deviations from the resonant frequency of the sample. The method () includes the steps of obtaining () a free induction decay signal from a magnetic resonance measurement of the sample, monitoring () from the free induction decay signal the deviation of the resonance frequency of the magnetic resonance measurement from a preselected resonance frequency; and adjusting () the magnetic field to maintain the preselected resonance frequency.


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