The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2006
Filed:
May. 18, 2005
Koichi Yoshihara, Tokyo, JP;
Kenichi Miyake, Saitama, JP;
Yoneo Akita, Tokyo, JP;
Tektronix International Sales GmbH, Schaffhausen, CH;
Abstract
A first test signal from a test signal source is provided to a spectrum analyzer to produce first measurement data. The test signal source is expressed by a first transfer function G(w) and the spectrum analyzer is expressed by second transfer function F(w). A second test signal is provided to the spectrum analyzer to produce second measurement data where the second test signal is derived from the first test signal by shifting the frequency by a known increment. From the first and second measurement data, the components are the same on G(w) but different on F(w). The G(w) components are cancelled by calculation using the first and second measurement data and then the second transfer function F(w) is evaluated independently of G(w).