The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2006
Filed:
Jul. 09, 2004
John W. Juvinall, Ottawa Lake, MI (US);
John W. Juvinall, Ottawa Lake, MI (US);
Owens-Brockway Glass Container Inc., Toledo, OH (US);
Abstract
An apparatus for inspecting a container having a central axis and a sidewall with circumferentially extending external ribs. The apparatus includes a light source for directing a line-shaped light beam onto an external surface of the container, a light sensor disposed to receive reflected portions of the line-shaped beam, and an information processor coupled to the light sensor to determine a geometric characteristic of the sidewall as a function of the reflected light energy. The line-shaped light beam preferably has a long dimension parallel to the container axis, and sufficient length to illuminate at least one rib peak and at least one valley between the rib peaks. The sensor may be a linear array sensor that is particularly useful for measuring out-of-round, or an area array sensor for measuring out-of-round and sidewall thickness.