The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2006
Filed:
Sep. 13, 2002
Paul Zombo, Cocoa, FL (US);
Paul Vona, Cocoa, FL (US);
Miguel A. Felix, Irwin, PA (US);
Siemens Westinghouser Power Corporation, Orlando, FL (US);
Abstract
A flaw inspection system () contains a substrate () to be inspected, such as a generator tube wall, a rotor of a generator, an aircraft skin, having or thought to have interior defects () such as stress cracks, where the substrate () has attached reference blocks () also containing defects () of the type that might be found in the substrate, where an ultrasonic generator () emits sound waves () which contact all the defects, causing heat () which is sensed by a thermal camera () which, in association with a controller () causes images () to appear on a monitor () from which the type and number of defects () in the substrate () can be determined.