The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2006

Filed:

Jun. 15, 2001
Applicants:

Victor Lyamichev, Madison, WI (US);

Hatim Allawi, Madison, WI (US);

Fang Dong, Broomfield, CO (US);

Bruce P. Neri, Madison, WI (US);

Tatiani I. Vener, Madison, WI (US);

Inventors:

Victor Lyamichev, Madison, WI (US);

Hatim Allawi, Madison, WI (US);

Fang Dong, Broomfield, CO (US);

Bruce P. Neri, Madison, WI (US);

Tatiani I. Vener, Madison, WI (US);

Assignee:

Third Wave Technologies, Inc., Madison, WI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01); C12N 15/00 (2006.01); C12N 15/63 (2006.01); C12N 1/20 (2006.01); C07H 21/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to methods and compositions for analyzing nucleic acids, and in particular, methods and compositions for detection and characterization of nucleic acid sequences and sequence changes. The present invention also provides methods and compositions for identifying oligonucleotides with desired hybridization properties to nucleic acid targets containing secondary structure.


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