The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2006
Filed:
May. 07, 2003
Paul Jackson Mcwhorter, Albuquerque, NM (US);
Samuel Lee Miller, Albuquerque, NM (US);
Jeffry Joseph Sniegowski, Tijeras, NM (US);
Murray Steven Rodgers, Albuquerque, NM (US);
Paul Jackson McWhorter, Albuquerque, NM (US);
Samuel Lee Miller, Albuquerque, NM (US);
Jeffry Joseph Sniegowski, Tijeras, NM (US);
Murray Steven Rodgers, Albuquerque, NM (US);
Other;
Abstract
A cutting blade () having a cutting edge () defined by an intersection of a first cutting edge surface () and a second cutting edge surface () is disclosed. The angle between the first cutting edge surface () and the second cutting edge surface () defines a blade angle (θ). The blade () may be fabricated from a wafer () by an anisotropic etch. An upper surface () of the wafer () is defined by a first set of 3 Miller indices, where at least one individual Miller index of this first set has an absolute value greater than 3. A top surface () of the blade () is defined by part of the upper surface () of the wafer (). The anisotropic etch proceeds until reaching a particular crystallographic plane to define the first cutting edge surface (). Having the top surface () of the blade () defined by the noted set of 3 Miller indices increases the potential that a blade angle (θ) of a desired magnitude may be realized.