The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 2006
Filed:
Oct. 09, 2002
Method and apparatus for isolating faulty semiconductor devices in a multiple stream graphics system
Tyvis C. Cheung, Sunnyvale, CA (US);
Nathaniel D. Naegle, Pleasanton, CA (US);
Tyvis C. Cheung, Sunnyvale, CA (US);
Nathaniel D. Naegle, Pleasanton, CA (US);
Sun Microsystems, Inc., Santa Clara, CA (US);
Abstract
A method and an apparatus are provided for isolating faulty semiconductor devices in a multiple stream graphics system. The apparatus includes a buffer adapted to receive a plurality of data streams. The apparatus further includes a convolver comprising at least one convolution signature register; a router adapted to route the data streams from the buffer to the convolver, wherein the router comprises at least one router signature register; and an analyzer adapted to access the convolution and router signature registers, wherein the analyzer is capable of isolating at least one of a faulty semiconductor device and a faulty interconnection using the contents of the convolution and router signature registers.