The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 2006
Filed:
Aug. 14, 2003
Amar Guettaf, Sunnyvale, CA (US);
Amar Guettaf, Sunnyvale, CA (US);
Broadcom Corporation, Irvine, CA (US);
Abstract
Circuits and methods to enhance scan testing by controlling clock pulses that are provided to memory devices within an integrated circuit are provided. An integrated circuit is provided that includes a scan testing clock control circuit and a memory bypass enable contact point. The scan testing clock control circuit enables control of a clock input signal to one or more memory devices within the integrated circuit. In one embodiment the scan testing clock control circuit includes a latch, and two AND gates. A scan test mode input and a memory bypass enable input are used to determine whether the memory will be permitted to receive a clock signal. Methods for scan testing using a scan testing clock control circuit are also provided.