The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 2006
Filed:
Nov. 25, 2002
Stephan Schröder, München, DE;
Wolfgang Helfer, München, DE;
Arndt Gruber, München, DE;
Infineon Technologies AG, Munich, DE;
Abstract
A method for repairing an integrated memory having first units of memory cells and second, redundant units of memory cells for replacing first units of memory cells. The first units of memory cells are tested with regard to their functionality. In the case of a defect ascertained in one of the first units, a number of redundant units is programmed as an associated cluster for replacing one or more of the first units. In this way, a repair element is formed with a cluster size corresponding to the number of redundant units. The cluster size of respective repair elements is set in a variable manner by a redundancy circuit. As a result, in a test and repair operation, a comparatively short test time of the memory is made possible in conjunction with a yield that remains good.