The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2006

Filed:

Jan. 11, 2002
Applicants:

Stefan B. Edlund, San Jose, CA (US);

Jussi Petri Myllymaki, San Jose, CA (US);

Inventors:

Stefan B. Edlund, San Jose, CA (US);

Jussi Petri Myllymaki, San Jose, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

Analysis of a history of previous location reports received from a tracked entity is performed and this analysis is utilized to estimate the relevance of future location reports over time. This is accomplished via associating a computed expiration time with each location report, wherein this expiration time is used by an application to estimate the relevance degradation of a location report over time. Thus, the expiration time value acts as a threshold that controls the shape of a relevance degradation curve of a location report.


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Edlund, Stefan. (2006). System for estimating the temporal validity of location reports through pattern analysis (U.S. Patent No. 7058668). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7058668

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