The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2006

Filed:

Feb. 18, 2005
Applicants:

Ryuichiro Maeyama, Ebina, JP;

Kenichi Kobayashi, Ebina, JP;

Tomoshi Hara, Minamiashigara, JP;

Kazuyuki Tsukamoto, Kanagawa, JP;

Koji Morofuji, Ebina, JP;

Tsutomu Udaka, Ebina, JP;

Shinichi Tai, Ebina, JP;

Inventors:

Ryuichiro Maeyama, Ebina, JP;

Kenichi Kobayashi, Ebina, JP;

Tomoshi Hara, Minamiashigara, JP;

Kazuyuki Tsukamoto, Kanagawa, JP;

Koji Morofuji, Ebina, JP;

Tsutomu Udaka, Ebina, JP;

Shinichi Tai, Ebina, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03G 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image forming apparatus with an image forming part and a fixing part for fixing images on a recording medium measures, downstream of the fixing part in a transport path, speckles on a recording medium, and generates measured speckle data representing the measured speckles; stores measured speckle data with standard speckle data representing speckles on a recording medium that has not undergone a fixing process; further measures, upstream of the image forming part, measures speckles on a recording medium; and when the stored standard speckle data is the most analogous to speckles measured for the second time, applies corrections in order to compensate for the lengthening of the recording medium by a fixing process to document images formed thereon, and when the stored measured speckle data is the most analogous to speckles measured for the second time, does not perform the corrections in order to compensate for the lengthening.


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