The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 2006
Filed:
Jul. 17, 2002
Applicants:
Gerard DE Haan, Eindhoven, NL;
Anna Pelagotti, Eindhoven, NL;
Inventors:
Gerard De Haan, Eindhoven, NL;
Anna Pelagotti, Eindhoven, NL;
Assignee:
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/48 (2006.01); G06K 9/36 (2006.01); G06K 9/40 (2006.01); H04N 5/14 (2006.01);
U.S. Cl.
CPC ...
Abstract
In a method of locating problem areas in an image signal (I), a motion vector field (Df) is estimated for the image signal (I), and edges are detected in the motion vector field (Df). In a corresponding method of interpolating images between existing images (I), image parts are interpolated (MCI) in dependence upon a presence of edges; preferably, an order statistical filtering (med) is used at edges.
Quick Actions:
De Haan, Gerard. (2006). Problem area location in an image signal (U.S. Patent No. 7058227). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7058227
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