The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2006

Filed:

Oct. 19, 2001
Applicants:

Yuichi Ikeda, Chiba, JP;

Nobuatsu Sasanuma, Chiba, JP;

Kazuo Suzuki, Kanagawa, JP;

Tomohisa Itagaki, Chiba, JP;

Nobuhiko Zaima, Chiba, JP;

Inventors:

Yuichi Ikeda, Chiba, JP;

Nobuatsu Sasanuma, Chiba, JP;

Kazuo Suzuki, Kanagawa, JP;

Tomohisa Itagaki, Chiba, JP;

Nobuhiko Zaima, Chiba, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

This invention relates to a method of setting anti-forgery information addition level while taking an apparatus individual difference into consideration. The method is employed by a data processing system including: an image processing apparatusfor processing an image; and a maintenance apparatus, connected with the image processing apparatus through a network, for setting a processing function of the image processing apparatus. The maintenance apparatusdetermines an anti-forgery information addition level depending on an individual difference of apparatuses, such as an exhaustion level of the image processing apparatus. The addition level determined by the maintenance apparatusis transmitted to the image processing apparatus. The image processing apparatusadds anti-forgery information to an inputted image at the addition level transmitted by the maintenance apparatus


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