The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 2006
Filed:
Mar. 12, 2003
Toru Yokohata, Kawasaki, JP;
Takahiro Imamura, Kawasaki, JP;
Toshiya Fujita, Kawasaki, JP;
Yojiro Ochiai, Kawasaki, JP;
Masahiro Ozeki, Kawasaki, JP;
Naoki Satake, Higashine, JP;
Toru Yokohata, Kawasaki, JP;
Takahiro Imamura, Kawasaki, JP;
Toshiya Fujita, Kawasaki, JP;
Yojiro Ochiai, Kawasaki, JP;
Masahiro Ozeki, Kawasaki, JP;
Naoki Satake, Higashine, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
A magnetic recording medium inspection method detects small protrusions that constitute defects on the surface of a magnetic recording medium. The method includes flying a glide inspection head at a predetermined height over the surface of the moving magnetic recording medium; detecting a contact duration time during which the glide head is in contact with a protrusion on the surface of the magnetic recording medium using a contact detection sensor attached to the glide inspection head; and determining the small protrusion based on the contact duration time.