The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7057166 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 06, 2006

Filed:

Jun. 25, 2004
Applicants:

Roger Guevremont, Ottawa, CA;

Govindanunny Thekkadath, Ottawa, CA;

Inventors:

Roger Guevremont, Ottawa, CA;

Govindanunny Thekkadath, Ottawa, CA;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B01D 59/44 (2006.01); H01J 49/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of separating ions, including a first species of ion and a second species of ion that are transmitted through an analyzer region under substantially identical electrical field conditions, is provided. The method includes separating ions within an analyzer region according to the FAIMS principle, such that the first species of ion and the second species of ion are selectively transmitted along a time-averaged first direction through a portion of the analyzer region between the ion origin end and the ion detection end. Subsequently, the first species of ion and the second species of ion within the analyzer region are separated according to a difference in low field ion mobility values, such that relatively more of one of the first species of ion and the second species of ion is transmitted to an ion detection end than is transmitted absent separating the first species of ion and the second species of ion within the analyzer region according to a difference in their low field ion mobility values. The ions are transmitted through the remainder of the analyzer region under normal FAIMS operating conditions.


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