The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 2006
Filed:
Sep. 11, 2003
Arthur Springsteen, Wilmington, OH (US);
Ian A. Cowe, Osbaldwick, GB;
Arthur Springsteen, Wilmington, OH (US);
Ian A. Cowe, Osbaldwick, GB;
Foss Analytical AB, Hoganas, SE;
Abstract
The present invention provides a reference standard for calibration of an analysis instrument. The reference standard comprises a solid body formed of a number of compounds and a substrate having scattering properties similar to a product to be analyzed with said analysis instrument and being spectrally neutral in a wavelength range to be used in the analysis instrument. The substrate and the compounds in combination with respect to intensity, wavelength and scattering properties imitate the spectral response of the product to be analyzed with said analysis instrument. The present invention also provides a method for calibration of an analysis instrument, which method comprises recording, by means of said analysis instrument, the spectral response of a reference standard comprising a solid body, which with respect to intensity, wavelength and scattering properties imitates the spectral response of a product to be analyzed with said analysis instrument; evaluating the differences between the response from said analysis instrument and an expected spectral response; and calibrating said analysis instrument according to the result of the evaluation.