The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2006

Filed:

Jul. 18, 2003
Applicants:

Ming-cheng Chang, Taoyuan, TW;

Yi-nan Chen, Taipei, TW;

Tse-yao Huang, Taipei, TW;

Inventors:

Ming-Cheng Chang, Taoyuan, TW;

Yi-Nan Chen, Taipei, TW;

Tse-Yao Huang, Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/302 (2006.01);
U.S. Cl.
CPC ...
Abstract

A deep trench self-alignment process for an active area of a partial vertical cell. A semiconductor substrate with two deep trenches is provided. A deep trench capacitor is formed in each deep trench, and an isolating layer is formed thereon. Each trench is filled with a mask layer. A photoresist layer is formed on the semiconductor substrate between the deep trenches, and the photoresist layer partially covers the mask layer. The semiconductor substrate is etched lower than the isolating layer using the photoresist layer and the mask layer as masks. The photoresist layer and the mask layer are removed, such that the pillar semiconductor substrate between the deep trenches functions as an active area.


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