The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2006

Filed:

Apr. 22, 2004
Applicants:

Jan Van Der Greef, Driebergen-Rijsenburg, NL;

Jacibus Thomas Wilhelmus Elisabeth Vogels, Utrecht, NL;

Florian Wulfert, Driebergen-Rijsenburg, NL;

Albert Tas, Lienden, NL;

Inventors:

Jan van der Greef, Driebergen-Rijsenburg, NL;

Jacibus Thomas Wilhelmus Elisabeth Vogels, Utrecht, NL;

Florian Wulfert, Driebergen-Rijsenburg, NL;

Albert Tas, Lienden, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01D 15/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

Method and system for processing and evaluating data from combination chromatographic and mass spectrometric data. The methods and system comprise data smoothing and determination of an quality factor for a chromatogram of a data set based on a determined entropy value. In one embodiment, the methods and system further comprise data baseline correction prior to entropy value determination. In a further embodiment, a correlation is determined between chromatograms processed according to the invention and one or more chromatograms of one or more data sets. Preferably, said correlation is performed using a multivariate analysis.


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