The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 06, 2006

Filed:

Nov. 28, 2003
Applicants:

Hitoshi Ishibashi, Tokyo, JP;

Noboru Sawayama, Tokyo, JP;

Inventors:

Hitoshi Ishibashi, Tokyo, JP;

Noboru Sawayama, Tokyo, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41J 29/393 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image forming apparatus includes an alignment pattern and an alignment pattern detector that detects the alignment pattern. The alignment pattern is formed in such a manner that a line image of a reference color and a line image of a color other than the reference color are superposed on each other with a predetermined shift amount. An acceptance width of the alignment pattern detector is determined so that the acceptance width satisfies a relation with a writing density of the image forming apparatus and a line width of the alignment pattern, as follows:[acceptance width]>[line width]/(5.0627×[writing density (dpi)]).


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