The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 2006
Filed:
Nov. 01, 2002
Peter Hajdukiewicz, Gloucestershire, GB;
Geoffrey Mcfarland, Gloucestershire, GB;
David Sven Wallace, Gloucestershire, GB;
Peter Hajdukiewicz, Gloucestershire, GB;
Geoffrey McFarland, Gloucestershire, GB;
David Sven Wallace, Gloucestershire, GB;
Renishaw PLC, Gloucestershire, GB;
Abstract
A method of calibrating an analogue probe () having a stylus () with a workpiece-contacting tip () or a non-contact probe (). A calibration artefact such as a calibration sphere () is mounted on a coordinate measuring machine (CMM) (). The probe () is mounted on an arm () of the CMM and the probe is moved along a path whilst continually scanning the surface of the calibration artefact such that the probe is exercised throughout its working range. For an analogue probe () having a workpiece-contacting stylus (), the path is such that the deflection of the stylus varies along the path. For a non-contact probe () the path is such that there is variation of the radial distance between the path and the calibration artefact. The probe path may comprise a path parallel to a chord of the calibration sphere or a curved, e.g. a sinusoidal, path.