The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2006

Filed:

Oct. 01, 2001
Applicants:

Yuging Gao, Mount Kisco, NY (US);

Michael A. Picheny, White Plains, NY (US);

Bhuvana Ramabhadran, Mount Kisco, NY (US);

Inventors:

Yuging Gao, Mount Kisco, NY (US);

Michael A. Picheny, White Plains, NY (US);

Bhuvana Ramabhadran, Mount Kisco, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G10L 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

N sets of feature vectors are generated from a set of observation vectors which are indicative of a pattern which it is desired to recognize. At least one of the sets of feature vectors is different than at least one other of the sets of feature vectors, and is preselected for purposes of containing at least some complimentary information with regard to the at least one other set of feature vectors. The N sets of feature vectors are combined in a manner to obtain an optimized set of feature vectors which best represents the pattern. The combination is performed via one of a weighted likelihood combination scheme and a rank-based state-selection scheme; preferably, it is done in accordance with an equation set forth herein. In one aspect, a weighted likelihood combination can be employed, while in another aspect, rank-based state selection can be employed. An apparatus suitable for performing the method is described, and implementation in a computer program product is also contemplated. The invention is applicable to any type of pattern recognition problem where robustness is important, such as, for example, recognition of speech, handwriting or optical characters under challenging conditions.


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