The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2006

Filed:

Aug. 28, 2003
Applicants:

Dominick A. Pagano, Weston, CT (US);

John Winkelman, Southbury, CT (US);

John Rojas, Norwalk, CT (US);

James Norris, Danbury, CT (US);

Inventors:

Dominick A. Pagano, Weston, CT (US);

John Winkelman, Southbury, CT (US);

John Rojas, Norwalk, CT (US);

James Norris, Danbury, CT (US);

Assignee:

Dapco Industries Inc., Ridgefield, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

An ultrasonic real-time inspection method which is user-friendly in an interactive environment to provide ease of operation, as well as a combination of consistency, thoroughness, and speed of operation in flaw detection not achievable by other methods. The method offers significantly increased pattern recognition capability, which provides greater automation potential and reduced missed detection and false alarm rates.


Find Patent Forward Citations

Pagano, Dominick. (2006). Method and system for analysis of ultrasonic reflections in real time (U.S. Patent No. 7054762). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7054762

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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