The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2006
Filed:
Dec. 25, 2002
Satoshi Fukunaga, Kyoto, JP;
Masato Nakayama, Higashikurume, JP;
Satoshi Fukunaga, Kyoto, JP;
Masato Nakayama, Higashikurume, JP;
ARKRAY, Inc, Kyoto, JP;
Abstract
A concentration measuring method includes selecting a calibration curve optimum for computing the concentration of a measurement target substance from a plurality of calibration curves based on an output from a reaction system containing the target substance and a reactant capable of reacting with the target substance, and computing the concentration of the target substance based on the optimum calibration curve and the output. Each of the calibration curves is prepared based on a plurality of outputs generated upon lapse of a same reaction time from a plurality of standard reaction systems each containing a standard reagent of a known different concentration and the reactant. The plurality of calibration curves differ from each other in reaction time based on which the calibration curves are prepared.