The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2006
Filed:
Jun. 07, 2005
Kazuma Shimizu, Ibaraki, JP;
Ryozo Yanagisawa, Shizuoka, JP;
Yoshikazu Sasago, Shizuoka, JP;
Yoshiyuki Batori, Shizuoka, JP;
Masanari Morioka, Shizuoka, JP;
Hiroshi Takarada, Shizuoka, JP;
Katsushi Koike, Chiba, JP;
Kazuma Shimizu, Ibaraki, JP;
Ryozo Yanagisawa, Shizuoka, JP;
Yoshikazu Sasago, Shizuoka, JP;
Yoshiyuki Batori, Shizuoka, JP;
Masanari Morioka, Shizuoka, JP;
Hiroshi Takarada, Shizuoka, JP;
Katsushi Koike, Chiba, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
Conventionally, in the process for inspecting a molded product, a measurement point indicating a portion to be measured is defined by using attribution information, such as a tolerance difference, and a measurement program is created, or a manual measurement instrument is employed to conduct the measurement. According to the invention, provided is an information processing apparatus supporting general measurement operations, including those for manual measurements, by using attribution information, such as a dimension and a dimensional tolerance, that is added to a CAD model generated by a CAD apparatus.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile