The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2006
Filed:
Nov. 06, 2001
Akira Oosawa, Kaisei-machi, JP;
Takefumi Nagata, Kaisei-machi, JP;
Kazuo Shimura, Kaisei-machi, JP;
Takeshi Ohkubo, Kaisei-machi, JP;
Akira Oosawa, Kaisei-machi, JP;
Takefumi Nagata, Kaisei-machi, JP;
Kazuo Shimura, Kaisei-machi, JP;
Takeshi Ohkubo, Kaisei-machi, JP;
Fuji Photo Film Co., Ltd., Kanagawa-ken, JP;
Abstract
In a measurement processing apparatus for measuring a geometric feature of an object image: a measurement-reference-element setting unit automatically sets at least one first measurement reference element for use in measurement of the geometric feature of the object image, at at least one first position on the object image based on first image data representing the object image and position information indicating at least one second position of at least one second measurement reference element which is set on a measurement reference image corresponding to the object image; and a geometric-feature measurement unit measures the geometric feature of the object image based on the at least one first position of the at least one first measurement reference element.