The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2006
Filed:
Feb. 15, 2002
Claude Zeller, Monroe, CT (US);
Donald G. Mackay, Roxbury, CT (US);
William Kilmartin, West Haven, CT (US);
Robert A. Cordery, Danbury, CT (US);
William A. Brosseau, Stratford, CT (US);
Hugh L. Brunk, Portland, OR (US);
Stephen K. Decker, Lake Oswego, OR (US);
Jun Tian, Tualatin, OR (US);
Claude Zeller, Monroe, CT (US);
Donald G. Mackay, Roxbury, CT (US);
William Kilmartin, West Haven, CT (US);
Robert A. Cordery, Danbury, CT (US);
William A. Brosseau, Stratford, CT (US);
Hugh L. Brunk, Portland, OR (US);
Stephen K. Decker, Lake Oswego, OR (US);
Jun Tian, Tualatin, OR (US);
Pitney Bowes Inc., Stamford, CT (US);
Digimarc Corporation, Beaverton, OR (US);
Abstract
The disclosure describes an authentication system and related methods for authenticating printed objects. The system uses an information-based metric along with one or more print quality metrics to provide accurate detection or classification of a counterfeit printed object. The print quality metric evaluates attributes of a subject image associated with the original printer, ink or paper to detect degradation of those operations due to copying operations like an image scanning and halftone printing subsequent to the original printing of the object. The information-based metric measures message symbol errors in an optically readable code, such as a digital watermark.