The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2006
Filed:
Mar. 28, 2002
Mark a Wahl, Windsor, CO (US);
Mark A Wahl, Windsor, CO (US);
Avago Technologies General IP Pte. Ltd., Singapore, SG;
Abstract
A method and apparatus for testing a serial connection is presented. A serial data stream is transmitted from a sending device to a receiving device. The serial data stream is generated using sending device timing information and input data. A receiver in the receiving device recovers both the timing information and the input data and then inputs them back into a transmitter located in the receiving device. The transmitter in the receiving device then generates a second serial data stream based on the recovered input data and the sending device timing information. A receiver in the sending device receives the second serial data stream and outputs the sending device timing information and input data to a FIFO buffer, for alignment of the input data. Since the input data and timing information are generated based on a sending device timing information, the FIFO can provide a signal for testing by performing phase alignment on the data. There is no need to re-synchronize the data in the sending device. Using the sending device timing information to generate and test information in the sending device, removes the need to test data using a FIFO in the receiving device and reduces the complexity and processing requirements of the FIFO in the sending device.