The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2006
Filed:
Apr. 05, 2001
Johann Engelhardt, Bad Schönborn, DE;
Jörg Bewersdorf, Heidelberg, DE;
Hilmar Gugel, Dossenheim, DE;
Juergen Hoffmann, Wiesbaden, DE;
Johann Engelhardt, Bad Schönborn, DE;
Jörg Bewersdorf, Heidelberg, DE;
Hilmar Gugel, Dossenheim, DE;
Juergen Hoffmann, Wiesbaden, DE;
Leica Microsystems Heidelberg GmbH, Mannheim, DE;
Abstract
The present invention concerns a double confocal scanning microscope () having an illuminating beam path () of at least one light source (), and a detected beam path () of at least one detector (), and in order to achieve almost the theoretically possible resolution capability, in particular in the context of multi-color fluorescence applications, is characterized in that the optical properties in particular of the components () arranged in the beam path are coordinated with one another in such a way that the accumulated aberrations, with respect to the optical axis () and/or at least one surface () in the specimen region, are at least of the order of magnitude of the theoretically achievable resolution capability.