The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2006

Filed:

Jan. 22, 2003
Applicants:

Nao Murakami, Ibaraki, JP;

Takashi Yamaoka, Ibaraki, JP;

Hiroyuki Yoshimi, Ibaraki, JP;

Yuuichi Nishikouji, Ibaraki, JP;

Masaki Hayashi, Ibaraki, JP;

Inventors:

Nao Murakami, Ibaraki, JP;

Takashi Yamaoka, Ibaraki, JP;

Hiroyuki Yoshimi, Ibaraki, JP;

Yuuichi Nishikouji, Ibaraki, JP;

Masaki Hayashi, Ibaraki, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02F 1/03 (2006.01); G02F 1/1335 (2006.01); G02B 5/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides a transparent optical film that has excellent optical characteristics for realizing the uniform retardation distribution and restraining rainbow-colored irregularities. The optical film, which is obtained by laminating a birefringent layer (a) on a transparent film (b), satisfies all the following formulae (I), (II) and (III).Δ()>Δ()×10  (I)1<()/()  (II)0.0005≦Δ()≦0.5  (III)In the above formulae (I), (II) and (III), Δn(a) and Δn(b) denote respectively birefringent indexes of the birefringent layer (a) and the transparent film (b). The signs of nx, ny and nz indicate refractive indexes in an X-axis direction, a Y-axis direction and a Z-axis direction in the birefringent layer (a), respectively. The X-axis corresponds to an axial direction exhibiting a maximum refractive index within a plane of the birefringent layer (a), the Y-axis corresponds to an axial direction perpendicular to the X-axis within the plane, and the Z-axis corresponds to a thickness direction perpendicular to the X-axis and the Y-axis.


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