The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2006
Filed:
Oct. 08, 1999
Eva M. Sevick-muraca, College Station, TX (US);
Ralf H. Mayer, McLean, VA (US);
Jeffery S. Reynolds, Granger, IN (US);
Eva M. Sevick-Muraca, College Station, TX (US);
Ralf H. Mayer, McLean, VA (US);
Jeffery S. Reynolds, Granger, IN (US);
The Texas A&M University System, College Station, TX (US);
Abstract
A system () of the present invention includes light source instrumentation () to selectively illuminate a light scattering medium including a luminophore and detection instrumentation () to detect multiply scattered light output from the medium in response to illumination by the light source instrumentation (). A processor () is operatively coupled to the detection instrumentation () to determine a first optical characterization of the medium from a first multiply scattered light output of a first illumination light wavelength and a second optical characterization of the medium from a second multiply scattered light output of a second illumination light wavelength different than the first illumination light wavelength. The processor () is operable to calculate lifetime of the luminophore from the first optical characterization, the second optical characterization, and a multiply scattered emission of the luminophore from the medium in response to excitation.