The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2006

Filed:

Jan. 23, 2002
Applicants:

Hiroaki Suzuki, Toki, JP;

Kazuhiko Nakada, Nisshin, JP;

Inventors:

Hiroaki Suzuki, Toki, JP;

Kazuhiko Nakada, Nisshin, JP;

Assignee:

Menicon Co., Ltd., Nagoya, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/00 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of obtaining particulars or characteristics of an ophthalmic lens by detecting a fluorescent light which is emitted from the ophthalmic lens upon exposure to an excitation light (UV light). The particulars or characteristics of the ophthalmic lens include, for instance, identifying marks such as characters, figures, symbols, etc. which are formed in the ophthalmic lens to identify the ophthalmic lens, a thickness of the ophthalmic lens such as a contact lens and an intraocular lens, and an angular position of the ophthalmic lens, particularly of a special contact lens having circumferential portions having respective different thickness values.


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