The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2006

Filed:

Mar. 14, 2005
Applicant:

Manabu Shimomura, Kyoto, JP;

Inventor:

Manabu Shimomura, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B01D 59/44 (2006.01); H01J 49/00 (2006.01); G01N 24/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

First, normal calibration is executed by introducing a standards sample to an MS portion, thereafter, an adjusting sample is introduced to a GC portion, and a mass spectrum is acquired by executing mass spectrometry by the MS portion with regard to an object substance separated by a column. A data processing portion compares a measured mass spectrum and a standard spectrum and modifies a standard spectrum constituting a target in executing calibration by using a standard sample from the result. The standard spectrum modified in this way is reflected with an error factor of a dispersion in a purity of the standard sample or the like and therefore, when recalibration of the MS portion using the standard sample is executed by constituting a target by the modified standard spectrum, a difference among apparatus is resolved.


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