The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2006
Filed:
Jan. 08, 2002
Satoshi Asai, Tokyo, JP;
Toshihito Nagata, Tokyo, JP;
Yasuo Takahashi, Tokyo, JP;
Yukimoto Ishii, Tokyo, JP;
Koichi Ishikawa, Tokyo, JP;
Satoshi Asai, Tokyo, JP;
Toshihito Nagata, Tokyo, JP;
Yasuo Takahashi, Tokyo, JP;
Yukimoto Ishii, Tokyo, JP;
Koichi Ishikawa, Tokyo, JP;
Nihon University, School Juridical Person, Tokyo, JP;
Abstract
The present invention provides a method of screening genes based on expression information differing from gene expression information obtainable by DNA chip/DNA microarray techniques. The method of screening genes comprises performing in situ hybridization in respect of a tissue or cell sample from an organism using a probe which specifically hybridizes with mRNA and/or expression sequence tag being a product of gene expression, and examining localization of the mRNA and/or expression sequence tag in the tissue or cell.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile