The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2006
Filed:
Jan. 25, 2002
Paul L. Lagraff, Blighton, MI (US);
Robert T. Letarte, Howell, MI (US);
Paul L. Lagraff, Blighton, MI (US);
Robert T. Letarte, Howell, MI (US);
Environmental Monitoring Systems, Inc., Charleston, SC (US);
Abstract
A slit impaction sampling device is for collecting airborne contaminants for subsequent analysis, includes a base with a microscope slide disposed thereon. The microscopic slide has an adhesive media located thereon to assist in adhering airborne particles on the microscopic slide. The base has a top cap secured thereto. The top cap has an inlet opening formed therethrough. The inlet opening has an outer venturi section and an inner laminar section that directs the air flow through the inlet opening into contact with the adhesive media such that the airborne particles form an impaction trace thereon. The air then flows around the microscope slide into an outlet passage and to a vacuum source.