The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 30, 2006
Filed:
Apr. 15, 2002
Applicant:
Terunobu Akiyama, Neuchatel, CH;
Inventor:
Terunobu Akiyama, Neuchatel, CH;
Assignee:
Institut de Microtechnique de l'Universite de Neuchatel, Neuchatel, CH;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 13/16 (2006.01);
U.S. Cl.
CPC ...
Abstract
An actuating and sensing device for scanning probe microscopes includes a tuning fork () containing two prongs, a connection device () such as a spring, and a probing tip (). The tip () is connected to both prongs of the tuning fork () with the connection device (). The tuning fork () is used as a mechanical resonator to vibrate. The movements of the prongs are transformed via the connection device () into movements of the tip (), wherein the tip movements can be in different planes than the movement plane of the prongs.