The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 2006
Filed:
Apr. 27, 2004
Applicants:
Hien T. Ha, Sunnyvale, CA (US);
George J. Chen, Union City, CA (US);
Robert E. Mains, Morgan Hill, CA (US);
Inventors:
Hien T. Ha, Sunnyvale, CA (US);
George J. Chen, Union City, CA (US);
Robert E. Mains, Morgan Hill, CA (US);
Assignee:
Sun Microsystems, Inc., Santa Clara, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G01R 27/26 (2006.01); G01R 27/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of estimating delay which includes configuring a first signal path and second signal path such that the first signal path is a victim signal path and the second signal path is an aggressor signal path, calculating Miller factors between the victim signal path and the aggressor signal path for a plurality of edge combinations between a victim signal edge and an aggressor signal edge, and using the Miller factors to perform a timing analysis.