The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 2006
Filed:
Jul. 31, 2002
Robert Francis Berry, Romsey, GB;
Robert Todd Dimpsey, Austin, TX (US);
Benjamin Joseph Hoflich, Austin, TX (US);
Frank Eliot Levine, Austin, TX (US);
Enio Manuel Pineda, Austin, TX (US);
Robert Francis Berry, Romsey, GB;
Robert Todd Dimpsey, Austin, TX (US);
Benjamin Joseph Hoflich, Austin, TX (US);
Frank Eliot Levine, Austin, TX (US);
Enio Manuel Pineda, Austin, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A system and method for monitoring software locks is presented. Metric data collection is invoked only when thin lock contention arises in a computer system's application layer. Instrumentation in a computer system's middleware layer tracks time-based metric information such as a waiting time for an application to acquire a lock. Instrumentation tracks garbage collection events and removes garbage collection time durations from time-based metric data as to not distort time-based metric data. Instrumentation also tracks quantity-based events such as the number of applications that request a particular lock. An instrumentation user may retrieve metric data for computer system performance analysis.