The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2006

Filed:

Jul. 25, 2003
Applicants:

Hiroshi Iseki, Arakawa-ku, Tokyo, JP;

Keita Abe, Tokyo, JP;

Yoshiyuki Ogawara, Tochigi, JP;

Inventors:

Hiroshi Iseki, Arakawa-ku, Tokyo, JP;

Keita Abe, Tokyo, JP;

Yoshiyuki Ogawara, Tochigi, JP;

Assignees:

PENTAX Corporation, Tokyo, JP;

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for modeling an implant to be applied to a defect of a bone comprises the steps of obtaining a plurality of tomographic image data of the bone based on measurement data by MRI, producing three-dimensional image data of the bone based on the plurality of tomographic image data, and estimating a shape of a missing born that was previously present or should have been present in the defect of the bone to obtain three-dimensional data of the implant. The estimating step comprises the steps of estimating a provisional shape of the implant which has a contour conformable with the shape of a contour of periphery of the side walls of the defect at the distal surface of the bone and has a predetermined thickness; and deleting data of portions of the provisional shape of the implant that overlap the bone from the data of the provisional shape of the implant so that the three-dimensional data of the implant has an outer peripheral shape that is conformable with the shape of the side walls of the defect.


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