The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2006

Filed:

Feb. 08, 2002
Applicants:

Igor N. Belykh, Palo Alto, CA (US);

Craig W. Cornelius, Menlo Park, CA (US);

Inventors:

Igor N. Belykh, Palo Alto, CA (US);

Craig W. Cornelius, Menlo Park, CA (US);

Assignee:

Eastman Kodak Company, Rochester, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for detecting and attenuating grid artifacts in a digital radiographic image comprising; providing an input digital radiographic image; processing the input digital radiographic image with a detection algorithm based on 2-D dynamic correlation in both spatial and frequency domains to determine whether the input digital radiographic image has a grid artifacts; and if it does detecting the grid orientation, frequency, and signal-to-noise ratio of the grid artifacts, designing a frequency bandstop (notch) digital 1-D filter as a function of the grid frequency and attenuation level; and suppressing the grid artifacts by further processing said input digital radiographic image with said designed filter to produce an output digital radiographic image of improved image quality.


Find Patent Forward Citations

Belykh, Igor. (2006). Method for antiscatter stationary grid artifacts detection and attenuation in digital radiographic images (U.S. Patent No. 7050618). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7050618

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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