The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 2006
Filed:
Aug. 23, 2004
Makoto Gohno, Tokyo, JP;
Makoto Gohno, Tokyo, JP;
GE Medical Systems Global Technology Company, LLC, Waukesha, WI (US);
Abstract
An imaging condition determining method for an x-ray CT apparatus for performing imaging by a helical scan. The method includes making a table of various imaging conditions in advance, extracting at least one imaging condition from the table in accordance with age, imaging region, imaging length of the patient as well as the highest-priority objective specified by a user, and displaying the exposure dose of the patient under the at least one imaging condition, enabling the user to adjust the exposure dose, and determining the imaging condition adjusted in response to the adjustment of the exposure dose to the at least one imaging condition.