The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 2006
Filed:
Aug. 30, 2001
Applicants:
Kouhei Kabuki, Hitachinaka, JP;
Yoshisada Ebata, Hitachinaka, JP;
Tadashi Suzuki, Kasama, JP;
Atsushi Hiyama, Oarai, JP;
Inventors:
Kouhei Kabuki, Hitachinaka, JP;
Yoshisada Ebata, Hitachinaka, JP;
Tadashi Suzuki, Kasama, JP;
Atsushi Hiyama, Oarai, JP;
Assignee:
Hitachi, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/427 (2006.01);
U.S. Cl.
CPC ...
Abstract
In order to improve spectral measurement accuracy during high-speed wavelength shifting, the appropriate sensitivity of the detection system is maintained by, prior to measurement of a sample, measuring the voltage value, then storing this value into a table, and maintaining the voltage value to be applied to the photodetector, and during measurement of the sample, reading out the maintained voltage value and applying it to the photodetector.