The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 2006
Filed:
Mar. 04, 2004
Applicants:
Yoshinori Ohsaki, Tochigi, JP;
Yuichi Osakabe, Tochigi, JP;
Inventors:
Yoshinori Ohsaki, Tochigi, JP;
Yuichi Osakabe, Tochigi, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B 27/42 (2006.01); G03B 27/54 (2006.01);
U.S. Cl.
CPC ...
Abstract
Provided is an exposure apparatus for exposing a pattern of a reticle mounted on a first stage onto a substrate which is mounted on a second stage through a projection optical system, in which focus calibration can be conducted with high precision and a throughput can be increased. The exposure apparatus includes at least three detection systems capable of simultaneously detecting three or more marks formed at different positions on at least one of the substrate and the second stage through the projection optical system.