The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 2006
Filed:
May. 02, 2005
David J. Kunst, Cupertino, CA (US);
Charles L. Vinn, Milpitas, CA (US);
David J. Kunst, Cupertino, CA (US);
Charles L. Vinn, Milpitas, CA (US);
Micrel, Incorporation, San Jose, CA (US);
Abstract
The present invention provides an apparatus and method for improving the accuracy of circuits. The apparatus includes a replicate circuit and a trim determination circuit. The trim determination circuit includes a measurable circuit element and determines the state of the measurable element. The replicate circuit includes a replicate circuit element which has similar electrical characteristics as the measurable element, and is configured to aid in determining an adjustable test current. The trim determination circuit generates a test current which is proportional to the adjustable test current. The test current is passed through the measurable element such that a first voltage drop occurs across the measurable element. A measured current is generated at a current level dictated by the voltage drop across the measurable element, such that the state of the measurable element is determined by the difference between the measured current and a scaled reference current.