The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 2006
Filed:
Jan. 29, 2003
Applicants:
Hideki Kambara, Hachioji, JP;
Zheng Ping LI, Baoding, CN;
Kazunori Okano, Shiki, JP;
Keiichi Nagai, Higashiyamato, JP;
Inventors:
Hideki Kambara, Hachioji, JP;
Zheng Ping Li, Baoding, CN;
Kazunori Okano, Shiki, JP;
Keiichi Nagai, Higashiyamato, JP;
Assignee:
Hitachi, LTD, Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12P 19/34 (2006.01); C12Q 1/68 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention relates to a quick and simple method for genetic testing, particularly for SNP testing, using two kinds of primers which are complementary to a mutant target and a wild-type target, respectively, and different in length or migration speed in electrophoresis. These probes are allowed to hybridize with targets, fluorophore-tagged nucleotides are attached to the primers, and electrophoresis is carried out for discriminatory detection.