The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 2006
Filed:
Oct. 14, 2002
Maik Jornitz, Bellport, NY (US);
Reinhard Baumfalk, Göttingen, DE;
Ralf Lausch, Göttingen, DE;
Christian Oldendorf, Göttingen, DE;
Oscar-werner Reif, Hannover, DE;
Maik Jornitz, Bellport, NY (US);
Reinhard Baumfalk, Göttingen, DE;
Ralf Lausch, Göttingen, DE;
Christian Oldendorf, Göttingen, DE;
Oscar-Werner Reif, Hannover, DE;
Sartorius AG, Gottingen, DE;
Abstract
The invention concerns a device and method for monitoring the integrity of filtering installations consisting of a filter housing () designed to perform integrity tests and for filtration, equipped with a plurality of filter elements () and an electronic testing and monitoring unit () designed for monitoring and performing integrity tests, said filter elements () having each a storage element and a communicating part () being connected to the monitoring and testing unit arranged in the filtering housing, whereon data of said electronic storage elements can be read. The invention also concerns a method for monitoring the integrity of filter installations by means of a plurality of filter elements () in a filter housing () and of an electronic testing and monitoting unit designed to monitor and perform integrity tests, data stored by electronic storage elements () arranged on the filter elements () capable of being exchanged with the monitoring and testing unit, identification data and other data concerning the filter elements derived from the electronic storage elements () capable of being selected and of constituting the basis for integrity monitoring and testing.