The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 2006

Filed:

Jul. 29, 2002
Applicant:

Katsunori Sakiyama, Akiruno, JP;

Inventor:

Katsunori Sakiyama, Akiruno, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 1/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A measuring endoscope system includes a menu display module that selects a menu according to display data which is associated in advance with any of a plurality of optical adaptors, and a measuring program for performing measurement according to the result of the selection performed by the menu display module. Consequently, in the measuring endoscope system, when a user designates an optical adaptor using an optical adaptor selection screen image displayed on an LCD by the menu display module, a measuring technique associated with the optical adaptor is automatically selected. When a user wants to perform measurement using the measuring endoscope system, the user should merely press a measurement execution switch included in an endoscopic operation unit. Thus, measurement in which the selected measuring technique is implemented is carried out. Consequently, the present invention has succeeded in improving the maneuverability of a measuring endoscope system in measurement and improving the efficiency thereof in inspection.


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