The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 2006
Filed:
Feb. 28, 2002
Applicants:
David A. Meckes, Allentown, PA (US);
James S. Lee, Jr., Phillipsburg, NJ (US);
Richard J. Roscioli, Bethlehem, PA (US);
Inventors:
David A. Meckes, Allentown, PA (US);
James S. Lee, Jr., Phillipsburg, NJ (US);
Richard J. Roscioli, Bethlehem, PA (US);
Assignee:
Bowe Bell + Howell Company, Durham, NC (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B65H 7/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
System and method for monitoring grouped resources. A system and method of monitoring resource units in a stack is provided. The system and method includes providing a group of resource units and determining a thickness of one or more of the resource units. The system and method also includes indicating when the group of resource units reaches a predetermined size after one or more of the resource units has been moved from the group.